AXIEM

Planar EM Analysis
AXIEM 3D planar method-of-moments (MoM) EM analysis simulator addresses passive structures, transmission lines, large planar antennas, and patch arrays. AXIEM software delivers the accuracy, capacity, and speed designers need to characterize and optimize passive components on RF PCBs, modules, LTCCs, MMICs, RFICs, and antennas.

Perform in-situ analysis/design verification to fully characterize RF/microwave devices and ensure design success.

Proprietary full-wave planar, open boundary MoM technology provides discrete- and fast-frequency sweeps.

Automatic adaptive meshing with advanced-hybrid meshing technology ensures reliable results.
Features at a Glance
- EXTRACT – Schematic-driven EM extraction technology/design flow
- Layout/Drawing Editor – 2D and 3D views with shape modifiers/de-featuring
- MoM Solver – Proprietary full-wave planar, open boundary MoM technology
- Meshing Technology – Automatic advanced-hybrid adaptive meshing
- Sources – Numerous excitation ports
- Visualization – Field visualization, as well as results post-processing
- Parametric Studies – Optimization, tuning, and yield analysis
- High-Performance Computing (HPC) – Multi-core configurations and asynchronous simulation
Applications
Characterize MMIC and RFIC on- and off-chip passive components such as interdigitated capacitors and spiral inductors. These components can easily be rendered in the 2D layout editor and parameterized for scaling, tuning, and optimization.
MMIC/RFIC, PCB, and Module Interconnects
Accurately capture the coupling and parasitic effects of a single critical transmission line or complex network of 3D planar interconnects and identify the source of potential design failures. The advanced-meshing technology addresses large, complex designs.
Master large, complex antennas and arrays in their entirety with fast-solver technology. Post-processing capabilities support visualization of currents on antennas and far-field antenna pattern measurements for linear, circular, and elliptical polarizations.